Hitachi Launch the World's Highest Resolution SEM
The new SU9000 Field Emission (FE) Scanning Electron Microscope (SEM) from Hitachi High-Technologies features novel electron optics which allow 0.4 nm resolution to be achieved at an accelerating voltage of 30 kV, with a usable magnification up to 3 Million times. This is believed to be the highest resolution-performance currently achievable on a commercially available instrument. Featuring a new
リリース、障害情報などのサービスのお知らせ
最新の人気エントリーの配信
j次のブックマーク
k前のブックマーク
lあとで読む
eコメント一覧を開く
oページを開く
Ferroelectric Material’s Unexpected Behavior Supports Memcomputing
Skin-like Electronics
Novel Memory Chips Made of Graphene Materials
Novel Gecko-Inspired Adhesive Device Holds Large Weights on Smooth Surfaces
Researchers Improve Infrared Photodetector Efficiency Using Nanomaterials
Alumina Nano-Coating Helps Improve Heat Transfer Rate of Solid Surfaces
Thermal Imaging of Buildings Gets More Affordable
Diamond Electronic Circuits Suitable for Extreme Conditions
Epitaxial Graphene May Become New Platform Material in Electronics
Lead-Free Materials Designed by Computer Simulation
Graphene is a Promising Material for Use in Spin Computers
Controlling the Piezoelectric Effect in Nanoscale Semiconductors
Magical Material Combining Ferroelectric and Ferromagnetic Properties
Imagine Computer Memory A Million Times Faster than What You are Used To
Miniature Insect-Like Robots Could Lead to Solid State Microids
JEOL's iPod Touch Enabled Mass Spectrometer Offers New Performance Features
Physicists Show Physically Separated Particles in Solid-State Devices can be Quantum-Mechanically Entangled
Silicon Nanowires to Succeed Silicon Transistors
First Piezoelectric Harvesting Device Fabricated Using MEMS Technology